Introduction to Focused Ion Beam Nanometrology

Introduction to Focused Ion Beam NanometrologyThis book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology.

and adopted new materials (glass

and Streptomyces

while the second volume focuses on thirteenth-century Anglo-French Apocalypses and medieval English seals

a strategic geographic location

In International Responses to Mass Atrocities in Africa

This study overturns twentieth-century thinking about pasticcio opera

while progress was noted for using GEBV for improving pearl millet

This book explores Britain’s involvement in Bulgaria between 1943 and 1949

the meanings of modernism

Khirbet et-Tannur is a Nabataean site dating from the second century B

and televisual works

and an informative dossier of reviews